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Standard and/or project under the direct responsibility of ISO/TC 202/SC 3 Secretariat Stage ICS
Microbeam analysis — Analytical electron microscopy — Guidelines of specimen preparation for transmission electron microscope using focused ion beam processing
20.20
Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
90.92
Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wire-like crystals by transmission electron microscopy
50.00
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
90.92
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
40.99
Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
60.60
Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
60.60
Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope
95.99
Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
90.92
Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
40.20
Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures
95.99
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
95.99
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
60.60

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