Reference number
ISO 20263:2017
© ISO 2024
ISO 20263:2017
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
Edition 1
2017-11
Retirada
Retirada (Edición 1, 2017)

Resumen

ISO 20263:2017 specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method. This document is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to the digitized image recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate and the digitalized image converted from an analogue image recorded on the photographic film by an image scanner.

Informaciones generales

  • Estado
     : Retirada
    Fecha de publicación
     : 2017-11
    Etapa
    : Retirada de la Norma Internacional [95.99]
  • Edición
     : 1
    Número de páginas
     : 45
  • Comité Técnico :
    ISO/TC 202/SC 3
    ICS :
    37.020  71.040.50 
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