Technical Specification
ISO/TS 25138:2025
Surface chemical analysis — Analysis of metal oxide films by glow discharge optical emission spectrometry
Reference number
ISO/TS 25138:2025
Edition 3
2025-02
Technical Specification
Preview
ISO/TS 25138:2025
87872
Indisponible en français
Publiée (Edition 3, 2025)

ISO/TS 25138:2025

ISO/TS 25138:2025
87872
Langue
Format
CHF 177
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Résumé

This document specifies a glow discharge optical emission spectrometric method for the determination of the thickness, mass per unit area and chemical composition of metal oxide films.

This method is applicable to oxide films 5 nm to 10 000 nm thick on metals. The metallic elements of the oxide can include one or more from Fe, Cr, Ni, Cu, Ti, Si, Mo, Zn, Mg, Mn, Zr and Al. Other elements that can be determined by the method are O, C, N, H, P and S.

Informations générales

  •  : Publiée
     : 2025-02
    : Norme internationale publiée [60.60]
  •  : 3
  • ISO/TC 201/SC 8
    71.040.40 
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