About
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Secretariat: JISC (Japan)
Committee Manager: -
Chairperson (until end 2024):Ms Laura Depero
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ISO Technical Programme Manager [TPM]:ISO Editorial Manager [EM]:
- Creation date: 2016
Scope
Standardization of methods for instrument specification, instrument calibration, instrument operation, data acquisition, data processing, and data analysis in the use of X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis for surface chemical and structural analysis.
Quick links
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Work programme
Drafts and new work items -
Working area
Working documents (user account required) -
ISO Electronic applications
IT Tools that help support the standards development process
This committee contributes with 4 standards to the following Sustainable Development Goals:
Liaison Committees from ISO/TC 201/SC 10
ISO/TC 201/SC 10 can access the documents of the committees below:
Reference | Title | ISO/IEC |
---|---|---|
ISO/TC 147 | Water quality | ISO |
ISO/TC 202 | Microbeam analysis | ISO |
ISO/TC 229 | Nanotechnologies | ISO |
ISO/TC 201/SC 10 - Secretariat
JISC (Japan)
Japan National Committee for Standardization of Surface Chemical Analysis
#202 Belcom Tsukuba Building
1-2-3 Ninomiya,
Tsukuba
Ibaraki 305-0051
Japan
1-2-3 Ninomiya,
Tsukuba
Ibaraki 305-0051
Japan