ISO 17901-2:2015

Published (Edition 1, 2015)

This publication was last reviewed and confirmed in 2020. Therefore this version remains current.

ISO 17901-2:2015

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Abstract

ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.

General information

Status
: Published

Publication date
: 2015-07

Stage
: International Standard under systematic review [90.20]
Edition
: 1

Number of pages
: 20
Technical Committee :
ISO/TC 172/SC 9

ICS :
31.020
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