Abstract
PreviewThis document specifies a low-voltage test method for detecting and locating defects (pores, cracks or pop-offs) that occur in enamel coatings of corrugated and/or undulated profiles and that extend down to the metal base.
The method is based on colour effects (optical method) and is applicable to the precise detection of defects and their exact position. It can be used for non-flat, more profiled shapes such as corrugated or undulated surfaces.
NOTE The low-voltage test is a non-destructive test for detecting defects extending down to the metal base and is, therefore, completely different in comparison to the high-voltage test in accordance with ISO 2746.
-
Status: PublishedPublication date: 2019-03
-
Edition: 1Number of pages: 4
-
- ICS :
- 25.220.50 Enamels
Buy this standard
| Format | Language | |
|---|---|---|
| std 1 40 | PDF + ePub | |
| std 2 40 | Paper |
- CHF40
Life cycle
Got a question?
Check out our FAQs
Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)
Keep up to date with ISO
Sign up to our newsletter for the latest news, views and product information.