Reference number
ISO/CD 16524
© ISO 2024
Committee Draft
ISO/CD 16524
Surface chemical analysis — Atomic force microscopy — Guideline for quantitative nanoscale potential measurement by Kelvin probe force microscopy
Edition 1
Deleted
Deleted
A draft is being reviewed by the committee.

Abstract

This document describes the standard procedures for the quantitative use of Kelvin probe force microscopy (KPFM). It includes reproducible measurements of contact potential differences (CPD), reliable deduction of the work function of the KPFM probe-tip in use, and quantitative evaluation of the lateral resolutions of CPD imaging with KPFM. This document is applicable to the quantitative analysis of KPFM surface potential imaging of solid material surfaces at the nanoscale.

General information

  • Status
     : Deleted
    Stage
    : Project cancelled [30.98]
  • Edition
     : 1
  • Technical Committee :
    ISO/TC 201/SC 9
  • RSS updates

Life cycle

Sustainable Development Goals

This standard contributes to the following Sustainable Development Goals

7
Affordable and Clean Energy
9
Industry, Innovation and Infrastructure

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